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Fig. 4


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(a) HR-TEM micrograph of extruded MOF material. (b) HR-TEM micrograph of MIL-101(Cr) crystal showing Fast Fourier Transform (FFT) analysis to determine (111) interplanar distance (i.e., 44.4 Å). Inset: Selected Area Electron Diffraction Pattern of (111) plane.

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