Dossier: Characterisation and Modeling of Low Permeability Media and Nanoporous Materials
Open Access

Figure 1.


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SEM image of the sample polished top surface (in the (x, z) plane) after creation of the U-shaped hole by FIB. The isolated parallelepipoid is regularly sliced in a (x, y) plane (by the FIB) and imaged (by the electron beam) at a 10-50 nm thickness until obtaining a 200-300 grayscale image stack.

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